中国电子商会信息工程测试专业委员会主办
今天是 2024年 09月 02日 星期一
中国电子商会信息工程测试专业委员会
Integrity archives
诚信档案
专家智库 您的位置:主页 > 诚信档案 > 专家智库 >
谢晓园 武汉大学计算机学院
2022-06-22 返回列表
谢晓园  武汉大学计算机学院  
教授、武汉大学特色化示范性软件学院副院长
 
从事产业研究领域:软件测评及应用    
 
专业特长所获荣誉:
2021年NASAC青年软件创新奖, CCF系统软件专委会&软件工程专委会 (该奖项针对在软件领域的科学研究、技术发明、系统开发及应用等方面有突出成就和重大贡献、年龄不超过40岁的软件领域研究人员,每年1-3人)
2021年 ACM SigSoft Distinguished Paper Award (CCF-A类会议,共同一作加唯一通讯)
2017年ACM SigEvo HUMIES银奖
2016年武汉大学珞珈青年学者
2015年湖北省科技进步一等奖 (排名: 5/10)
2009 年International Conference on Quality Software最佳论文奖
 
 
主要论著业内成果:
X. Xie, B. Xu, Essential Spectrum-based Fault Localization, Springer, 2021(学术专著)
X. Xie (通讯), Y. Su, S. Chen, L. Chen, J. Xuan and B. Xu, MULA: A Just-In-Time Multi-labeling System for Issue Reports, IEEE Transactions on Reliability (TR), vol. 71, no. 1, pp. 250-263, March 2022. (中科院分区2021升级版 计算机大类二区Top)
X. Xie, H. Yang, Q. He and L. Chen, Towards Understanding Tool-chain Bugs in the LLVM Compiler Infrastructure, IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER), 2021, pp. 1-11. (软件工程CCF B类会议)
S. Chen, S. Jin and X. Xie (共同一作+通讯), Testing Your Question Answering Software via Asking Recursively, the 36th IEEE/ACM International Conference on Automated Software Engineering (ASE), 2021, pp. 104-116. (软件工程CCF A类会议, ACM Distinguished Paper Award)
S. Jin, S. Chen and X. Xie (通讯), Property-based Test for Part-of-Speech Tagging Tool, the 36th IEEE/ACM International Conference on Automated Software Engineering (ASE), NIER Track, 2021, pp. 1306-1311. (软件工程CCF A类会议)
S. Chen, S. Jin and X. Xie (共同一作+通讯), Validation on machine reading comprehension software without annotated labels: a property-based method, the 29th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE), 2021, pp. 590–602. (软件工程CCF A类会议)
S. Chen, X. Xie (共同一作+通讯), B. Yin, Y. Ji, L. Chen and B. Xu, Stay Professional and Efficient: Automatically Generate Titles for Your Bug Reports, the 35th IEEE/ACM International Conference on Automated Software Engineering (ASE), 2020, pp. 385-397. (软件工程CCF A类会议)
X. Xie (通讯), Z. Zhang, T. Y. Chen, Y. Liu, P. -L. Poon and B. Xu, METTLE: A METamorphic Testing Approach to Assessing and Validating Unsupervised Machine Learning Systems, IEEE Transactions on Reliability (TR), vol. 69, no. 4, pp. 1293-1322, Dec. 2020. (中科院分区2021升级版 计算机大类二区Top)
S. Yoo, X. Xie (通讯), F-C. Kuo, T. Y. Chen, M. Harman, Human Competitiveness of Genetic Programming in Spectrum-Based Fault Localisation: Theoretical and Empirical Analysis, ACM Transactions on Software Engineering and Methodology (TOSEM), 2017, 26(1), pp. 4:1-4:30. (软件工程CCF-A类期刊)
X. Xie (通讯), T. Y. Chen, F.-C. Kuo, B. W. Xu, A Theoretical Analysis of The Risk Evaluation Formulas for Spectrum-Based Fault Localization, ACM Transactions on Software Engineering and Methodology (TOSEM), 2013, 22(4), pp. 31:1-31:40. (软件工程CCF-A类期刊)
X. Xie, Z. Liu, S. Song, Z. Chen, J. Xuan and B.W. Xu, Revisit of Automatic Debugging via Human Focus-tracking, International Conference on Software Engineering (ICSE), 2016, pp.808-819. (软件工程CCF-A类会议)
J. Tu, X. Xie (通讯), T. Y. Chen , B. Xu , On the analysis of spectrum based fault localization using hitting sets, Journal of Systems and Software (JSS), 2019,147, pp: 106-123. (软件工程CCF-B类期刊)
 
学术、社团职务:
CCF软件工程专委会执委、CCF开源发展委员会执委。

 
二维码
中国电子商会信息工程测试专业委员会 电话:010-87660482 传真:010-87660482 邮箱:ceietn@sina.com 地址:北京经济技术开发区博兴六路17号院1号楼3层(100176)
Copyright © 2021-2027 中国电子信息工程与测试网 版权所有 主办单位:中国电子商会信息工程测试专业委员会 技术支持:电设信科(北京)技术有限公司 备案号:京ICP备11002915号-001